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Timeline
Chapter title |
Core Composition of Partial Dislocations in N-Doped 4H-SiC Determined by TEM Techniques, Dislocation Core Reconstruction and Image Contrast Analysis
|
---|---|
Chapter number | 33 |
Book title |
Microscopy of Semiconducting Materials 2007
|
Published in |
ADS, January 2008
|
DOI | 10.1007/978-1-4020-8615-1_33 |
Book ISBNs |
978-1-4020-8614-4, 978-1-4020-8615-1
|
Authors |
Michaël Texier*, Maryse Lancin, Gabrielle Regula, Bernard Pichaud, Texier*, Michaël, Lancin, Maryse, Regula, Gabrielle, Pichaud, Bernard |