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Mendeley readers
Chapter title |
Novel Method for the Measurement of STEM Specimen Thickness by HAADF Imaging
|
---|---|
Chapter number | 35 |
Book title |
Microscopy of Semiconducting Materials 2007
|
Published in |
ADS, January 2008
|
DOI | 10.1007/978-1-4020-8615-1_35 |
Book ISBNs |
978-1-4020-8614-4, 978-1-4020-8615-1
|
Authors |
V Grillo, E Carlino, Grillo, V, Carlino, E |
Mendeley readers
The data shown below were compiled from readership statistics for 6 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
Country | Count | As % |
---|---|---|
Unknown | 6 | 100% |
Demographic breakdown
Readers by professional status | Count | As % |
---|---|---|
Student > Ph. D. Student | 2 | 33% |
Professor | 1 | 17% |
Lecturer | 1 | 17% |
Other | 1 | 17% |
Unknown | 1 | 17% |
Readers by discipline | Count | As % |
---|---|---|
Materials Science | 3 | 50% |
Physics and Astronomy | 1 | 17% |
Unknown | 2 | 33% |