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Mendeley readers
Chapter title |
Calibration and Applications of Scanning Capacitance Microscopy: n-Type GaN
|
---|---|
Chapter number | 99 |
Book title |
Microscopy of Semiconducting Materials 2007
|
Published in |
ADS, January 2008
|
DOI | 10.1007/978-1-4020-8615-1_99 |
Book ISBNs |
978-1-4020-8614-4, 978-1-4020-8615-1
|
Authors |
J Sumner, R A Oliver, M J Kappers, C J Humphreys, Sumner, J, Oliver, R A, Kappers, M J, Humphreys, C J |
Mendeley readers
The data shown below were compiled from readership statistics for 4 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
Country | Count | As % |
---|---|---|
France | 1 | 25% |
Unknown | 3 | 75% |
Demographic breakdown
Readers by professional status | Count | As % |
---|---|---|
Researcher | 1 | 25% |
Student > Postgraduate | 1 | 25% |
Student > Doctoral Student | 1 | 25% |
Student > Master | 1 | 25% |
Readers by discipline | Count | As % |
---|---|---|
Materials Science | 2 | 50% |
Physics and Astronomy | 1 | 25% |
Engineering | 1 | 25% |