↓ Skip to main content

Microscopy of Semiconducting Materials 2007

Overview of attention for book
Cover of 'Microscopy of Semiconducting Materials 2007'

Table of Contents

  1. Altmetric Badge
    Book Overview
  2. Altmetric Badge
    Chapter 1 Microscopy of Semiconducting Materials 2007
  3. Altmetric Badge
    Chapter 2 Elastic Strain Distribution in GaN/AlN Quantum Dot Structures: Theory and Experiment
  4. Altmetric Badge
    Chapter 3 Concentration Evaluation in Nanometre-Sized In x Ga 1- x N Islands Using Transmission Electron Microscopy
  5. Altmetric Badge
    Chapter 4 Optical Properties of InGaN Quantum Dots With and Without a GaN Capping Layer
  6. Altmetric Badge
    Chapter 5 Strain Relaxation in an AlGaN/GaN Quantum Well System
  7. Altmetric Badge
    Chapter 6 Characterisation of In x Al 1-x N Epilayers Grown on GaN
  8. Altmetric Badge
    Chapter 7 Generation of Misfit Dislocations in Highly Mismatched GaN/AlN Layers
  9. Altmetric Badge
    Chapter 8 InN Nanorods and Epilayers: Similarities and Differences
  10. Altmetric Badge
    Chapter 9 Residual Strain Variations in MBE-Grown InN Thin Films
  11. Altmetric Badge
    Chapter 10 Growth of c-Plane GaN Films on (100) γ-LiAlO 2 by Hydride Vapour Phase Epitaxy
  12. Altmetric Badge
    Chapter 11 Interaction of Stacking Faults in Wurtzite a -Plane GaN on r -Plane Sapphire
  13. Altmetric Badge
    Chapter 12 Composite Substrates for GaN Growth
  14. Altmetric Badge
    Chapter 13 GaN Layers Grown by MOCVD on Composite SiC Substrate
  15. Altmetric Badge
    Chapter 14 An Initial Exploration of GaN Grown on a Ge-(111) Substrate
  16. Altmetric Badge
    Chapter 15 Electron Microscopy Characterization of a Graded AlN/GaN Multilayer Grown by Plasma-Assisted MBE
  17. Altmetric Badge
    Chapter 16 The Effect of Silane Treatment of Al x Ga 1−x N Surfaces
  18. Altmetric Badge
    Chapter 17 Quantitative Analysis of Deformation Around a Nanoindentation in GaN by STEM Diffraction
  19. Altmetric Badge
    Chapter 18 Microstructure of (Ga,Fe)N Films Grown by Metal-Organic Chemical Vapour Deposition
  20. Altmetric Badge
    Chapter 19 Nanostructures on GaN by Microsphere Lithography
  21. Altmetric Badge
    Chapter 20 On the Nature of Eu in Eu-Doped GaN
  22. Altmetric Badge
    Chapter 21 Recent Studies of Heteroepitaxial Systems
  23. Altmetric Badge
    Chapter 22 Nitrogen-Enhanced Indium Segregation in (Ga,In)(N,As)/GaAs Multiple Quantum Wells
  24. Altmetric Badge
    Chapter 23 Nanoscale Characterisation of MBE-Grown GaMnN/(001) GaAs
  25. Altmetric Badge
    Chapter 24 Antiphase Boundaries in GaAs/Ge and GaP/Si
  26. Altmetric Badge
    Chapter 25 Investigation of the Local Ge Concentration in Si/SiGe Multi-QW Structures by CBED Analysis and FEM Calculations
  27. Altmetric Badge
    Chapter 26 Crystal Lattice Defects in MBE Grown Si Layers Heavily Doped with Er
  28. Altmetric Badge
    Chapter 27 Epitaxial (001) Ge on Crystalline Oxide Grown on (001) Si
  29. Altmetric Badge
    Chapter 28 Analysis of Ge:Mn Magnetic Semiconductor Layers by XPS and Auger Electron Spectroscopy/Microscopy
  30. Altmetric Badge
    Chapter 29 Reduction of Threading Dislocations in Epitaxial ZnO Films Grown on Sapphire (0001)
  31. Altmetric Badge
    Chapter 30 Progress in Aberration-Corrected High-Resolution Transmission Electron Microscopy of Crystalline Solids
  32. Altmetric Badge
    Chapter 31 Strain Measurements in SiGe Devices by Aberration-Corrected High Resolution Electron Microscopy
  33. Altmetric Badge
    Chapter 32 (S)TEM Characterisation of InAs/MgO/Co Multilayers
  34. Altmetric Badge
    Chapter 33 Core Composition of Partial Dislocations in N-Doped 4H-SiC Determined by TEM Techniques, Dislocation Core Reconstruction and Image Contrast Analysis
  35. Altmetric Badge
    Chapter 34 Three-Dimensional Atom Probe Characterisation of III-Nitride Quantum Well Structures
  36. Altmetric Badge
    Chapter 35 Novel Method for the Measurement of STEM Specimen Thickness by HAADF Imaging
  37. Altmetric Badge
    Chapter 36 STEMSIM—a New Software Tool for Simulation of STEM HAADF Z-Contrast Imaging
  38. Altmetric Badge
    Chapter 37 On the Role of Specimen Thickness in Chemistry Quantification by HAADF
  39. Altmetric Badge
    Chapter 38 Accurate and Fast Multislice Simulations of HAADF Image Contrast by Parallel Computing
  40. Altmetric Badge
    Chapter 39 Z-contrast STEM 3D Information by Abel transform in Systems with Rotational Symmetry
  41. Altmetric Badge
    Chapter 40 Quantifying the Top-Bottom Effect in Energy-Dispersive X-Ray Spectroscopy of Nanostructures Embedded in Thin Films
  42. Altmetric Badge
    Chapter 41 Effect of Temperature on the 002 Electron Structure Factor and its Consequence for the Quantification of Ternary and Quaternary III–V Crystals
  43. Altmetric Badge
    Chapter 42 Calculation of Debye-Waller Temperature Factors for GaAs
  44. Altmetric Badge
    Chapter 43 The Use of the Geometrical Phase Analysis to Measure Strain in Nearly Periodic Images
  45. Altmetric Badge
    Chapter 44 Cross Section High Resolution Imaging of Polymer-Based Materials
  46. Altmetric Badge
    Chapter 45 Direct Observation of Carbon Nanotube Growth by Environmental Transmission Electron Microscopy
  47. Altmetric Badge
    Chapter 46 Band-Gap Modification Induced in HgTe by Dimensional Constraint in Carbon Nanotubes: Effect of Nanotube Diameter on Microstructure
  48. Altmetric Badge
    Chapter 47 Gold Catalyzed Silicon Nanowires: Defects in the Wires and Gold on the Wires
  49. Altmetric Badge
    Chapter 48 Electron Microscopy Analysis of AlGaN/GaN Nanowires Grown by Catalyst-Assisted Molecular Beam Epitaxy
  50. Altmetric Badge
    Chapter 49 Epitaxial Growth of Single Crystalline GaN Nanowires on (0001) Al 2 O 3
  51. Altmetric Badge
    Chapter 50 Structural Characterisation of GaP <111>B Nanowires by HRTEM
  52. Altmetric Badge
    Chapter 51 Structural and Chemical Properties of ZnTe Nanowires Grown on GaAs
  53. Altmetric Badge
    Chapter 52 TEM Characterization of ZnO Nanorods
  54. Altmetric Badge
    Chapter 53 TEM Characterization of ZnO Nanorods
  55. Altmetric Badge
    Chapter 54 TEM Characterization of ZnO Nanorods
  56. Altmetric Badge
    Chapter 55 Transmission Electron Microscopy Study of Sb-Based Quantum Dots
  57. Altmetric Badge
    Chapter 56 TEM Characterization of Self-Organized (In,Ga)N Quantum Dots
  58. Altmetric Badge
    Chapter 57 Investigating the Capping of InAs Quantum Dots by InGaAs
  59. Altmetric Badge
    Chapter 58 Comparing InGaAs and GaAsSb Metamorphic Buffer Layers on GaAs Substrates for InAs Quantum Dots Emitting at 1.55μm
  60. Altmetric Badge
    Chapter 59 Structural and Compositional Properties of Strain-Symmetrized SiGe/Si Heterostructures
  61. Altmetric Badge
    Chapter 60 EELS and STEM Assessment of Composition Modulation in InAlAs Tensile Buffer Layers of InGaAs /InAlAs /(100)InP Structures
  62. Altmetric Badge
    Chapter 61 In situ Observation of the Growth of Tungsten Oxide Nanostructures
  63. Altmetric Badge
    Chapter 62 Gas Sensing Properties of Vapour-Deposited Tungsten Oxide Nanostructures
  64. Altmetric Badge
    Chapter 63 Morphology of Semiconductor Nanoparticles
  65. Altmetric Badge
    Chapter 64 Light Emission from Si Nanostructures
  66. Altmetric Badge
    Chapter 65 Hydrogenated Nanocrystalline Silicon Investigated by Conductive Atomic Force Microscopy
  67. Altmetric Badge
    Chapter 66 Structural Characterization of Nanocrystalline Silicon Layers Grown by LEPECVD for Optoelectronic Applications
  68. Altmetric Badge
    Chapter 67 Electron Tomography of Mesoporous Silica for Gas Sensor Applications
  69. Altmetric Badge
    Chapter 68 Electron Energy-Loss Spectrum Imaging of an HfSiO High- k Dielectric Stack with a TaN Metal Gate
  70. Altmetric Badge
    Chapter 69 Elemental Profiling of III-V MOSFET High- k Dielectric Gate Stacks Using EELS Spectrum Imaging
  71. Altmetric Badge
    Chapter 70 Low-Energy Ion-Beam-Synthesis of Semiconductor Nanocrystals in Very Thin High-k Layers for Memory Applications
  72. Altmetric Badge
    Chapter 71 Nucleation, Crystallisation and Phase Segregation in HfO2 and HfSiO
  73. Altmetric Badge
    Chapter 72 High Accuracy and Resolution for the Separation of Nickel Silicide Polymorphs by Improved Analyses of EELS Spectra
  74. Altmetric Badge
    Chapter 73 TEM Study of Ytterbium Silicide Thin Films
  75. Altmetric Badge
    Chapter 74 TEM Study of the Silicidation Process in Pt/Si and Ir/Si Structures
  76. Altmetric Badge
    Chapter 75 The Dielectric Properties of Co-Implanted SiO 2 Investigated Using Spatially-Resolved EELS
  77. Altmetric Badge
    Chapter 76 Removing Relativistic Effects in EELS for the Determination of Optical Properties
  78. Altmetric Badge
    Chapter 77 Analytical STEM Comparative Study of the Incorporation of Covalent (Ge) or Heterovalent (As) Atoms in Silicon Crystal
  79. Altmetric Badge
    Chapter 78 Lattice Location Determination of Ge in SiC by ALCHEMI
  80. Altmetric Badge
    Chapter 79 Moore's Law and its Effect on Microscopy in the Semiconductor Industry
  81. Altmetric Badge
    Chapter 80 Tomographic Analysis of a FinFET Structure
  82. Altmetric Badge
    Chapter 81 3—D Characterisation of the Electrostatic Potential in an Electrically Biased Silicon Device
  83. Altmetric Badge
    Chapter 82 Three-Dimensional Field Models for Reverse Biased P-N Junctions
  84. Altmetric Badge
    Chapter 83 Automated Quantification of Dimensions on Tomographic Reconstructions of Semiconductor Devices
  85. Altmetric Badge
    Chapter 84 Dopant Profiling in the TEM: Progress Towards Quantitative Electron Holography
  86. Altmetric Badge
    Chapter 85 Observation of Dopant Distribution in Compound Semiconductors Using Off-axis Electron Holography
  87. Altmetric Badge
    Chapter 86 Dopant Profiling of Silicon Calibration Specimens by Off-Axis Electron Holography
  88. Altmetric Badge
    Chapter 87 Novel Approach for Visualizing Implants in Deep Submicron Microelectronic Devices Using Dopant Selective Etching and Low keV SEM
  89. Altmetric Badge
    Chapter 88 Quantitative Dopant Profiling in the SEM Including Surface States
  90. Altmetric Badge
    Chapter 89 On the Asymmetric Splitting of CBED HOLZ Lines under the Gate of Recessed SiGe Source/Drain Transistors
  91. Altmetric Badge
    Chapter 90 CBED and FE Study of Thin Foil Relaxation in Cross-Section Samples of Si /Si 1-x Ge x and Si /Si 1-x Ge x /Si Heterostructures
  92. Altmetric Badge
    Chapter 91 Stress and Strain Measurement in Stressed Silicon Lines
  93. Altmetric Badge
    Chapter 92 Measuring Strain in Semiconductor Nanostructures by Convergent Beam Electron Diffraction
  94. Altmetric Badge
    Chapter 93 Nano-FIB from Research to Applications — a European Scalpel for Nanosciences
  95. Altmetric Badge
    Chapter 94 Advanced Focused Ion Beam Specimen Preparation for Examination by Off-Axis Electron Holography
  96. Altmetric Badge
    Chapter 95 Critical Thickness for Semiconductor Specimens Prepared using Focused Ion Beam Milling
  97. Altmetric Badge
    Chapter 96 Organic-Based Micropillar Structure Fabrication by Advanced Focused Ion Beam Milling Techniques
  98. Altmetric Badge
    Chapter 97 Controlled Band Gap Modulation of Hydrogenated Dilute Nitrides by SEM-Cathodoluminescence
  99. Altmetric Badge
    Chapter 98 Interdiffusion as the First Step of GaN Quantum Dot Degradation Demonstrated by Cathodoluminescence Experiments
  100. Altmetric Badge
    Chapter 99 Calibration and Applications of Scanning Capacitance Microscopy: n-Type GaN
  101. Altmetric Badge
    Chapter 100 The Factors Influencing the Stability of Scanning Capacitance Spectroscopy
  102. Altmetric Badge
    Chapter 101 Growth and in vivo STM of III-V Compound Semiconductors
  103. Altmetric Badge
    Chapter 102 Mapping Defects in Dielectrics with Dynamic Secondary Electron Contrast in the low Vacuum SEM
  104. Altmetric Badge
    Chapter 103 EBIC Characterization of Light Emitting Structures Containing InGaN/GaN MQW
  105. Altmetric Badge
    Chapter 104 EBIC Characterisation of Diffusion and Recombination of Minority Carriers in GaN-Based LEDs
  106. Altmetric Badge
    Chapter 105 A Parametric Study of a Diode-Resistor Contrast Model for SEM-REBIC of Electroceramics
Overall attention for this book and its chapters
Altmetric Badge

Mentioned by

wikipedia
1 Wikipedia page

Readers on

mendeley
19 Mendeley
You are seeing a free-to-access but limited selection of the activity Altmetric has collected about this research output. Click here to find out more.
Title
Microscopy of Semiconducting Materials 2007
Published by
Springer Netherlands, December 2008
DOI 10.1007/978-1-4020-8615-1
ISBNs
978-1-4020-8614-4, 978-1-4020-8615-1
Editors

Cullis, A. G., Midgley, P. A.

Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 19 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
United Kingdom 1 5%
Unknown 18 95%

Demographic breakdown

Readers by professional status Count As %
Researcher 5 26%
Student > Master 4 21%
Student > Ph. D. Student 3 16%
Student > Postgraduate 2 11%
Other 1 5%
Other 3 16%
Unknown 1 5%
Readers by discipline Count As %
Physics and Astronomy 11 58%
Materials Science 5 26%
Immunology and Microbiology 1 5%
Chemistry 1 5%
Unknown 1 5%