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Mendeley readers
Chapter title |
Structural Characterization of Nanocrystalline Silicon Layers Grown by LEPECVD for Optoelectronic Applications
|
---|---|
Chapter number | 66 |
Book title |
Microscopy of Semiconducting Materials 2007
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Published in |
ADS, January 2008
|
DOI | 10.1007/978-1-4020-8615-1_66 |
Book ISBNs |
978-1-4020-8614-4, 978-1-4020-8615-1
|
Authors |
M Texier, M Acciarri, S Binetti, D Cavalcoli, A Cavallini, D Chrastina, G Isella, M Lancin, A Le Donne, A Tomasi, B Pichaud, S Pizzini, M Rossi, Texier, M, Acciarri, M, Binetti, S, Cavalcoli, D, Cavallini, A, Chrastina, D, Isella, G, Lancin, M, Donne, A Le, Tomasi, A, Pichaud, B, Pizzini, S, Rossi, M |
Mendeley readers
The data shown below were compiled from readership statistics for 3 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
Country | Count | As % |
---|---|---|
Unknown | 3 | 100% |
Demographic breakdown
Readers by professional status | Count | As % |
---|---|---|
Professor > Associate Professor | 1 | 33% |
Researcher | 1 | 33% |
Unknown | 1 | 33% |
Readers by discipline | Count | As % |
---|---|---|
Physics and Astronomy | 1 | 33% |
Unknown | 2 | 67% |