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Mendeley readers
Chapter title |
Measuring Strain in Semiconductor Nanostructures by Convergent Beam Electron Diffraction
|
---|---|
Chapter number | 92 |
Book title |
Microscopy of Semiconducting Materials 2007
|
Published in |
ADS, January 2008
|
DOI | 10.1007/978-1-4020-8615-1_92 |
Book ISBNs |
978-1-4020-8614-4, 978-1-4020-8615-1
|
Authors |
L Clément, J-L Rouviere, F Cacho, R Pantel, Clément, L, Rouviere, J-L, Cacho, F, Pantel, R |
Mendeley readers
The data shown below were compiled from readership statistics for 1 Mendeley reader of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
Country | Count | As % |
---|---|---|
Unknown | 1 | 100% |
Demographic breakdown
Readers by professional status | Count | As % |
---|---|---|
Student > Doctoral Student | 1 | 100% |
Readers by discipline | Count | As % |
---|---|---|
Engineering | 1 | 100% |