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Mendeley readers
Chapter title |
Strain Measurements in SiGe Devices by Aberration-Corrected High Resolution Electron Microscopy
|
---|---|
Chapter number | 31 |
Book title |
Microscopy of Semiconducting Materials 2007
|
Published in |
ADS, January 2008
|
DOI | 10.1007/978-1-4020-8615-1_31 |
Book ISBNs |
978-1-4020-8614-4, 978-1-4020-8615-1
|
Authors |
F Hüe, M J Hÿtch, J-M Hartmann, Y Bogumilowicz, A Claverie, Hüe, F, Hÿtch, M J, Hartmann, J-M, Bogumilowicz, Y, Claverie, A |
Mendeley readers
The data shown below were compiled from readership statistics for 7 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
Country | Count | As % |
---|---|---|
Unknown | 7 | 100% |
Demographic breakdown
Readers by professional status | Count | As % |
---|---|---|
Student > Ph. D. Student | 3 | 43% |
Student > Bachelor | 1 | 14% |
Other | 1 | 14% |
Student > Postgraduate | 1 | 14% |
Unknown | 1 | 14% |
Readers by discipline | Count | As % |
---|---|---|
Engineering | 2 | 29% |
Materials Science | 2 | 29% |
Earth and Planetary Sciences | 1 | 14% |
Physics and Astronomy | 1 | 14% |
Unknown | 1 | 14% |