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Chapter title |
Analysis of Ge:Mn Magnetic Semiconductor Layers by XPS and Auger Electron Spectroscopy/Microscopy
|
---|---|
Chapter number | 28 |
Book title |
Microscopy of Semiconducting Materials 2007
|
Published in |
ADS, January 2008
|
DOI | 10.1007/978-1-4020-8615-1_28 |
Book ISBNs |
978-1-4020-8614-4, 978-1-4020-8615-1
|
Authors |
Yu A Danilov, E S Demidov, S Yu Zubkov, V P Lesnikov, G A Maximov, D E Nikolitchev, V V Podolskii, Danilov, Yu A, Demidov, E S, Zubkov, S Yu, Lesnikov, V P, Maximov, G A, Nikolitchev, D E, Podolskii, V V |