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Timeline
Mendeley readers
Chapter title |
Critical Thickness for Semiconductor Specimens Prepared using Focused Ion Beam Milling
|
---|---|
Chapter number | 95 |
Book title |
Microscopy of Semiconducting Materials 2007
|
Published in |
ADS, January 2008
|
DOI | 10.1007/978-1-4020-8615-1_95 |
Book ISBNs |
978-1-4020-8614-4, 978-1-4020-8615-1
|
Authors |
A C Twitchett-Harrison, R E Dunin-Borkowski, P A Midgley, Twitchett-Harrison, A C, Dunin-Borkowski, R E, Midgley, P A |
Mendeley readers
The data shown below were compiled from readership statistics for 1 Mendeley reader of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
Country | Count | As % |
---|---|---|
Spain | 1 | 100% |
Demographic breakdown
Readers by professional status | Count | As % |
---|---|---|
Student > Ph. D. Student | 1 | 100% |
Readers by discipline | Count | As % |
---|---|---|
Materials Science | 1 | 100% |