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Timeline
Chapter title |
Automated Quantification of Dimensions on Tomographic Reconstructions of Semiconductor Devices
|
---|---|
Chapter number | 83 |
Book title |
Microscopy of Semiconducting Materials 2007
|
Published in |
ADS, January 2008
|
DOI | 10.1007/978-1-4020-8615-1_83 |
Book ISBNs |
978-1-4020-8614-4, 978-1-4020-8615-1
|
Authors |
A Kalio, O Richard, E Sourty, H Bender, Kalio, A, Richard, O, Sourty, E, Bender, H |