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Chapter title |
Hot Carrier Reliability Issues of Junctionless Transistor due to Interface Trap Charges for Analog/RF Applications
|
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Chapter number | 76 |
Book title |
Physics of Semiconductor Devices
|
Published by |
Springer, Cham, January 2014
|
DOI | 10.1007/978-3-319-03002-9_76 |
Book ISBNs |
978-3-31-903001-2, 978-3-31-903002-9
|
Authors |
Yogesh Pratap, S. Haldar, R. S. Gupta, Mridula Gupta, Pratap, Yogesh, Haldar, S., Gupta, R. S., Gupta, Mridula |