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Chapter title |
A Comparison of Hot Carrier and 50 MeV Li 3+ Ion Induced Degradation in the Electrical Characteristics of Advanced 200 GHz SiGe HBT
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Chapter number | 27 |
Book title |
Physics of Semiconductor Devices
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Published by |
Springer, Cham, January 2014
|
DOI | 10.1007/978-3-319-03002-9_27 |
Book ISBNs |
978-3-31-903001-2, 978-3-31-903002-9
|
Authors |
K. C. Praveen, N. Pushpa, M. N. Bharathi, John D. Cressler, A. P. Gnana Prakash, Praveen, K. C., Pushpa, N., Bharathi, M. N., Cressler, John D., Gnana Prakash, A. P. |