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Chapter title |
Impact of Scaling Gate Oxide Thickness on the Performance of Silicon Based Triple Gate Rectangular Nwfet
|
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Chapter number | 146 |
Book title |
Physics of Semiconductor Devices
|
Published by |
Springer, Cham, January 2014
|
DOI | 10.1007/978-3-319-03002-9_146 |
Book ISBNs |
978-3-31-903001-2, 978-3-31-903002-9
|
Authors |
Deepika Jamwal, Devi Dass, Rakesh Prasher, Rakesh Vaid, Jamwal, Deepika, Dass, Devi, Prasher, Rakesh, Vaid, Rakesh |