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Mendeley readers
Chapter title |
Analysis of Novel Stress Enhancement Effect Based on Damascene Gate Process with eSiGe S/D for pFETs
|
---|---|
Chapter number | 26 |
Book title |
Simulation of Semiconductor Processes and Devices 2007
|
Published by |
Springer, Vienna, January 2007
|
DOI | 10.1007/978-3-211-72861-1_26 |
Book ISBNs |
978-3-21-172860-4, 978-3-21-172861-1
|
Authors |
S. Yamakawa, J. Wang, Y. Tateshita, K. Nagano, M. Tsukamoto, H. Ohri, N. Nagashima, H. Ansai, Yamakawa, S., Wang, J., Tateshita, Y., Nagano, K., Tsukamoto, M., Ohri, H., Nagashima, N., Ansai, H. |
Mendeley readers
The data shown below were compiled from readership statistics for 2 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
Country | Count | As % |
---|---|---|
Unknown | 2 | 100% |
Demographic breakdown
Readers by professional status | Count | As % |
---|---|---|
Student > Ph. D. Student | 1 | 50% |
Researcher | 1 | 50% |
Readers by discipline | Count | As % |
---|---|---|
Mathematics | 1 | 50% |
Engineering | 1 | 50% |