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Mendeley readers
Chapter title |
Modeling of Re-Sputtering Induced Bridge of Tungsten Bit-Lines for NAND Flash Memory Cell with 37nm Node Technology
|
---|---|
Chapter number | 11 |
Book title |
Simulation of Semiconductor Processes and Devices 2007
|
Published by |
Springer, Vienna, January 2007
|
DOI | 10.1007/978-3-211-72861-1_11 |
Book ISBNs |
978-3-21-172860-4, 978-3-21-172861-1
|
Authors |
Byungjoon Hwang, Yero Lee, Jeong-Guk Min, Hwakyung Shin, Namsu Lim, Sungjin Kim, Won-Young Chung, Tai-Kyung Kim, Jang-Ho Park, Yun-Kyoung Lee, Donghwa Kwak, Jaekwan Park, Won-Seong Lee |
Mendeley readers
The data shown below were compiled from readership statistics for 3 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
Country | Count | As % |
---|---|---|
Unknown | 3 | 100% |
Demographic breakdown
Readers by professional status | Count | As % |
---|---|---|
Student > Ph. D. Student | 1 | 33% |
Researcher | 1 | 33% |
Student > Master | 1 | 33% |
Readers by discipline | Count | As % |
---|---|---|
Engineering | 2 | 67% |
Mathematics | 1 | 33% |