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Mendeley readers
Chapter title |
Strain Induced Drain-Current Enhancement Mechanism in Short-Channel Bulk Ge-pMOSFETs with Different Channel and Surface Orientations
|
---|---|
Chapter number | 6 |
Book title |
Simulation of Semiconductor Processes and Devices 2007
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Published by |
Springer, Vienna, January 2007
|
DOI | 10.1007/978-3-211-72861-1_6 |
Book ISBNs |
978-3-21-172860-4, 978-3-21-172861-1
|
Authors |
Hiroshi Takeda, Takeo Ikezawa, Michihito Kawada, Masami Hane, Takeda, Hiroshi, Ikezawa, Takeo, Kawada, Michihito, Hane, Masami |
Mendeley readers
The data shown below were compiled from readership statistics for 10 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
Country | Count | As % |
---|---|---|
Unknown | 10 | 100% |
Demographic breakdown
Readers by professional status | Count | As % |
---|---|---|
Researcher | 4 | 40% |
Student > Ph. D. Student | 3 | 30% |
Other | 2 | 20% |
Unknown | 1 | 10% |
Readers by discipline | Count | As % |
---|---|---|
Physics and Astronomy | 3 | 30% |
Engineering | 3 | 30% |
Materials Science | 1 | 10% |
Mathematics | 1 | 10% |
Unknown | 2 | 20% |