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Mendeley readers
Chapter title |
Validation of the Effect of Full Stress Tensor in Hole Transport in Strained 65nm-Node pMOSFETs
|
---|---|
Chapter number | 7 |
Book title |
Simulation of Semiconductor Processes and Devices 2007
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Published by |
Springer, Vienna, January 2007
|
DOI | 10.1007/978-3-211-72861-1_7 |
Book ISBNs |
978-3-21-172860-4, 978-3-21-172861-1
|
Authors |
E. Tsukuda, Y. Kamakura, H. Takashino, T. Okagaki, T. Uchida, T. Hayashi, M. Tanizawa, K. Eikyu, S. Wakahara, K. Ishikawa, O. Tsuchiya, Y. Inoue, K. Taniguchi, Tsukuda, E., Kamakura, Y., Takashino, H., Okagaki, T., Uchida, T., Hayashi, T., Tanizawa, M., Eikyu, K., Wakahara, S., Ishikawa, K., Tsuchiya, O., Inoue, Y., Taniguchi, K. |
Mendeley readers
The data shown below were compiled from readership statistics for 3 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
Country | Count | As % |
---|---|---|
Unknown | 3 | 100% |
Demographic breakdown
Readers by professional status | Count | As % |
---|---|---|
Student > Ph. D. Student | 2 | 67% |
Researcher | 1 | 33% |
Readers by discipline | Count | As % |
---|---|---|
Mathematics | 1 | 33% |
Engineering | 1 | 33% |
Unknown | 1 | 33% |