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Introduction to Focused Ion Beams : Instrumentation, Theory, Techniques and Practice
Overview of attention for book
Table of Contents
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Book Overview
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Chapter 1
The Focused Ion Beam Instrument
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Chapter 2
Ion - Solid Interactions
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Chapter 3
Focused Ion Beam Gases for Deposition and Enhanced Etch
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Chapter 4
Three-Dimensional Nanofabrication Using Focused Ion Beams
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Chapter 5
Device Edits and Modifications
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Chapter 6
The Uses of Dual Beam FIB in Microelectronic Failure Analysis
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Chapter 7
High Resolution Live Imaging of FIB Milling Processes for Optimum Accuracy
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Chapter 8
FIB for Materials Science Applications - a Review
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Chapter 9
Practical Aspects of FIB Tem Specimen Preparation
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Chapter 10
FIB Lift-Out Specimen Preparation Techniques
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Chapter 11
A FIB Micro-Sampling Technique and a Site Specific TEM Specimen Preparation Method
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Chapter 12
Dual-Beam (FIB-SEM) Systems
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Chapter 13
Focused Ion Beam Secondary Ion Mass Spectrometry (FIB-SIMS)
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Chapter 14
Quantitative Three-Dimensional Analysis Using Focused Ion Beam Microscopy
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Chapter 15
Application of FIB in Combination with Auger Electron Spectroscopy
Overall attention for this book and its chapters
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Mentioned by
syllabi
1
institution with syllabi
patent
1
patent
wikipedia
3
Wikipedia pages
Citations
dimensions_citation
753
Dimensions
Readers on
mendeley
450
Mendeley
Book overview
1. The Focused Ion Beam Instrument
2. Ion - Solid Interactions
3. Focused Ion Beam Gases for Deposition and Enhanced Etch
4. Three-Dimensional Nanofabrication Using Focused Ion Beams
5. Device Edits and Modifications
6. The Uses of Dual Beam FIB in Microelectronic Failure Analysis
7. High Resolution Live Imaging of FIB Milling Processes for Optimum Accuracy
8. FIB for Materials Science Applications - a Review
9. Practical Aspects of FIB Tem Specimen Preparation
10. FIB Lift-Out Specimen Preparation Techniques
11. A FIB Micro-Sampling Technique and a Site Specific TEM Specimen Preparation Method
12. Dual-Beam (FIB-SEM) Systems
13. Focused Ion Beam Secondary Ion Mass Spectrometry (FIB-SIMS)
14. Quantitative Three-Dimensional Analysis Using Focused Ion Beam Microscopy
15. Application of FIB in Combination with Auger Electron Spectroscopy
Summary
Syllabi
Patents
Wikipedia
Dimensions citations
This data is correct as of December 2015 - for more up to date information, please visit
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Business, Engineering, Biology, History, Law