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Introduction to Focused Ion Beams : Instrumentation, Theory, Techniques and Practice

Overview of attention for book
Attention for Chapter 11: A FIB Micro-Sampling Technique and a Site Specific TEM Specimen Preparation Method
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Chapter title
A FIB Micro-Sampling Technique and a Site Specific TEM Specimen Preparation Method
Chapter number 11
Book title
Introduction to Focused Ion Beams
Published in
ADS, January 2005
DOI 10.1007/0-387-23313-x_11
Book ISBNs
978-0-387-23116-7, 978-0-387-23313-0
Authors

T. Kamino, T. Yaguchi, T. Hashimoto, T. Ohnishi, K. Umemura, Kamino, T., Yaguchi, T., Hashimoto, T., Ohnishi, T., Umemura, K.

Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 27 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Spain 1 4%
Germany 1 4%
Unknown 25 93%

Demographic breakdown

Readers by professional status Count As %
Student > Ph. D. Student 9 33%
Researcher 6 22%
Student > Doctoral Student 4 15%
Student > Master 2 7%
Student > Bachelor 2 7%
Other 2 7%
Unknown 2 7%
Readers by discipline Count As %
Engineering 7 26%
Materials Science 7 26%
Physics and Astronomy 5 19%
Business, Management and Accounting 2 7%
Medicine and Dentistry 1 4%
Other 2 7%
Unknown 3 11%