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Introduction to Focused Ion Beams : Instrumentation, Theory, Techniques and Practice

Overview of attention for book
Attention for Chapter 9: Practical Aspects of FIB Tem Specimen Preparation
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mendeley
17 Mendeley
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Chapter title
Practical Aspects of FIB Tem Specimen Preparation
Chapter number 9
Book title
Introduction to Focused Ion Beams
Published in
ADS, January 2005
DOI 10.1007/0-387-23313-x_9
Book ISBNs
978-0-387-23116-7, 978-0-387-23313-0
Authors

Ron Anderson, Stanley J. Klepeis, Anderson, Ron, Klepeis, Stanley J.

Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 17 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Germany 1 6%
Unknown 16 94%

Demographic breakdown

Readers by professional status Count As %
Researcher 6 35%
Student > Ph. D. Student 6 35%
Student > Master 2 12%
Student > Doctoral Student 1 6%
Student > Bachelor 1 6%
Other 1 6%
Readers by discipline Count As %
Materials Science 7 41%
Engineering 5 29%
Physics and Astronomy 5 29%
Business, Management and Accounting 1 6%