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Mendeley readers
Chapter title |
The Uses of Dual Beam FIB in Microelectronic Failure Analysis
|
---|---|
Chapter number | 6 |
Book title |
Introduction to Focused Ion Beams
|
Published in |
ADS, January 2005
|
DOI | 10.1007/0-387-23313-x_6 |
Book ISBNs |
978-0-387-23116-7, 978-0-387-23313-0
|
Authors |
Becky Holdford, Holdford, Becky |
Mendeley readers
The data shown below were compiled from readership statistics for 8 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
Country | Count | As % |
---|---|---|
Unknown | 8 | 100% |
Demographic breakdown
Readers by professional status | Count | As % |
---|---|---|
Student > Ph. D. Student | 3 | 38% |
Researcher | 2 | 25% |
Unspecified | 1 | 13% |
Student > Postgraduate | 1 | 13% |
Student > Master | 1 | 13% |
Other | 0 | 0% |
Readers by discipline | Count | As % |
---|---|---|
Physics and Astronomy | 2 | 25% |
Business, Management and Accounting | 2 | 25% |
Materials Science | 2 | 25% |
Unspecified | 1 | 13% |
Engineering | 1 | 13% |
Other | 0 | 0% |