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Electrical Atomic Force Microscopy for Nanoelectronics

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Attention for Chapter 6: Characterizing Ferroelectricity with an Atomic Force Microscopy: An All-Around Technique
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Chapter title
Characterizing Ferroelectricity with an Atomic Force Microscopy: An All-Around Technique
Chapter number 6
Book title
NanoScience and Technology
Published by
Springer, Cham, August 2019
DOI 10.1007/978-3-030-15612-1_6
Book ISBNs
978-3-03-015611-4, 978-3-03-015612-1
Authors

Simon Martin, Brice Gautier, Nicolas Baboux, Alexei Gruverman, Adrian Carretero-Genevrier, Martí Gich, Andres Gomez, Martin, Simon, Gautier, Brice, Baboux, Nicolas, Gruverman, Alexei, Carretero-Genevrier, Adrian, Gich, Martí, Gomez, Andres

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The data shown below were collected from the profile of 1 X user who shared this research output. Click here to find out more about how the information was compiled.
Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 15 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Unknown 15 100%

Demographic breakdown

Readers by professional status Count As %
Researcher 4 27%
Student > Ph. D. Student 4 27%
Lecturer 1 7%
Other 1 7%
Professor 1 7%
Other 0 0%
Unknown 4 27%
Readers by discipline Count As %
Materials Science 4 27%
Engineering 2 13%
Physics and Astronomy 2 13%
Agricultural and Biological Sciences 1 7%
Unknown 6 40%