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Electrical Atomic Force Microscopy for Nanoelectronics

Overview of attention for book
Attention for Chapter 9: Space Charge at Nanoscale: Probing Injection and Dynamic Phenomena Under Dark/Light Configurations by Using KPFM and C-AFM
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Citations

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14 Mendeley
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Chapter title
Space Charge at Nanoscale: Probing Injection and Dynamic Phenomena Under Dark/Light Configurations by Using KPFM and C-AFM
Chapter number 9
Book title
Electrical Atomic Force Microscopy for Nanoelectronics
Published by
Springer, Cham, January 2019
DOI 10.1007/978-3-030-15612-1_9
Book ISBNs
978-3-03-015611-4, 978-3-03-015612-1
Authors

Christina Villeneuve-Faure, Kremena Makasheva, Laurent Boudou, Gilbert Teyssedre, Villeneuve-Faure, Christina, Makasheva, Kremena, Boudou, Laurent, Teyssedre, Gilbert

Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 14 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Unknown 14 100%

Demographic breakdown

Readers by professional status Count As %
Student > Ph. D. Student 3 21%
Unspecified 2 14%
Student > Master 2 14%
Researcher 2 14%
Student > Bachelor 1 7%
Other 0 0%
Unknown 4 29%
Readers by discipline Count As %
Materials Science 4 29%
Unspecified 2 14%
Immunology and Microbiology 1 7%
Biochemistry, Genetics and Molecular Biology 1 7%
Chemistry 1 7%
Other 1 7%
Unknown 4 29%