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Mendeley readers
| Chapter title |
Electrical AFM for the Analysis of Resistive Switching
|
|---|---|
| Chapter number | 7 |
| Book title |
Electrical Atomic Force Microscopy for Nanoelectronics
|
| Published by |
Springer, Cham, January 2019
|
| DOI | 10.1007/978-3-030-15612-1_7 |
| Book ISBNs |
978-3-03-015611-4, 978-3-03-015612-1
|
| Authors |
Stefano Brivio, Jacopo Frascaroli, Min Hwan Lee, Brivio, Stefano, Frascaroli, Jacopo, Lee, Min Hwan |
Mendeley readers
The data shown below were compiled from readership statistics for 7 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
| Country | Count | As % |
|---|---|---|
| Unknown | 7 | 100% |
Demographic breakdown
| Readers by professional status | Count | As % |
|---|---|---|
| Professor > Associate Professor | 2 | 29% |
| Student > Bachelor | 1 | 14% |
| Researcher | 1 | 14% |
| Student > Master | 1 | 14% |
| Unknown | 2 | 29% |
| Readers by discipline | Count | As % |
|---|---|---|
| Physics and Astronomy | 2 | 29% |
| Engineering | 2 | 29% |
| Unknown | 3 | 43% |