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Electrical Atomic Force Microscopy for Nanoelectronics

Overview of attention for book
Attention for Chapter 10: Conductive AFM of 2D Materials and Heterostructures for Nanoelectronics
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Chapter title
Conductive AFM of 2D Materials and Heterostructures for Nanoelectronics
Chapter number 10
Book title
Electrical Atomic Force Microscopy for Nanoelectronics
Published by
Springer, Cham, January 2019
DOI 10.1007/978-3-030-15612-1_10
Book ISBNs
978-3-03-015611-4, 978-3-03-015612-1
Authors

Filippo Giannazzo, Giuseppe Greco, Fabrizio Roccaforte, Chandreswar Mahata, Mario Lanza, Giannazzo, Filippo, Greco, Giuseppe, Roccaforte, Fabrizio, Mahata, Chandreswar, Lanza, Mario

Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 18 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Unknown 18 100%

Demographic breakdown

Readers by professional status Count As %
Student > Ph. D. Student 6 33%
Researcher 5 28%
Student > Master 2 11%
Student > Bachelor 1 6%
Unknown 4 22%
Readers by discipline Count As %
Engineering 6 33%
Materials Science 4 22%
Physics and Astronomy 2 11%
Agricultural and Biological Sciences 1 6%
Energy 1 6%
Other 0 0%
Unknown 4 22%