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Mendeley readers
| Chapter title |
Scanning Microwave Impedance Microscopy (sMIM) in Electronic and Quantum Materials
|
|---|---|
| Chapter number | 12 |
| Book title |
Electrical Atomic Force Microscopy for Nanoelectronics
|
| Published by |
Springer, Cham, January 2019
|
| DOI | 10.1007/978-3-030-15612-1_12 |
| Book ISBNs |
978-3-03-015611-4, 978-3-03-015612-1
|
| Authors |
Kurt A. Rubin, Yongliang Yang, Oskar Amster, David A. Scrymgeour, Shashank Misra, Rubin, Kurt A., Yang, Yongliang, Amster, Oskar, Scrymgeour, David A., Misra, Shashank |
Mendeley readers
The data shown below were compiled from readership statistics for 12 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
| Country | Count | As % |
|---|---|---|
| Unknown | 12 | 100% |
Demographic breakdown
| Readers by professional status | Count | As % |
|---|---|---|
| Student > Ph. D. Student | 3 | 25% |
| Other | 2 | 17% |
| Student > Doctoral Student | 1 | 8% |
| Researcher | 1 | 8% |
| Student > Postgraduate | 1 | 8% |
| Other | 0 | 0% |
| Unknown | 4 | 33% |
| Readers by discipline | Count | As % |
|---|---|---|
| Materials Science | 4 | 33% |
| Physics and Astronomy | 2 | 17% |
| Engineering | 2 | 17% |
| Unknown | 4 | 33% |