749 followers
What is better to speak (write, actually) about one of your favourite topics in the World than a book chapter?, where there is no limitation of pages to write... https://t.co/mz2sHDesDa
Electrical Atomic Force Microscopy for Nanoelectronics
Overview of attention for book
Table of Contents
-
Altmetric BadgeBook Overview
-
Altmetric BadgeChapter 1 The Atomic Force Microscopy for Nanoelectronics
-
Altmetric BadgeChapter 2 Conductive AFM for Nanoscale Analysis of High-k Dielectric Metal Oxides
-
Altmetric BadgeChapter 3 Mapping Conductance and Carrier Distributions in Confined Three-Dimensional Transistor Structures
-
Altmetric BadgeChapter 4 Scanning Capacitance Microscopy for Two-Dimensional Carrier Profiling of Semiconductor Devices
-
Altmetric BadgeChapter 5 Oxidation and Thermal Scanning Probe Lithography for High-Resolution Nanopatterning and Nanodevices
-
Altmetric BadgeChapter 6 Characterizing Ferroelectricity with an Atomic Force Microscopy: An All-Around Technique
-
Altmetric BadgeChapter 7 Electrical AFM for the Analysis of Resistive Switching
-
Altmetric BadgeChapter 8 Magnetic Force Microscopy for Magnetic Recording and Devices
-
Altmetric BadgeChapter 9 Space Charge at Nanoscale: Probing Injection and Dynamic Phenomena Under Dark/Light Configurations by Using KPFM and C-AFM
-
Altmetric BadgeChapter 10 Conductive AFM of 2D Materials and Heterostructures for Nanoelectronics
-
Altmetric BadgeChapter 11 Diamond Probes Technology
-
Altmetric BadgeChapter 12 Scanning Microwave Impedance Microscopy (sMIM) in Electronic and Quantum Materials
Attention for Chapter 5:
Oxidation and Thermal Scanning Probe Lithography for High-Resolution Nanopatterning and Nanodevices