You are seeing a free-to-access but limited selection of the activity Altmetric has collected about this research output.
Click here to find out more.
Chapter title |
Modeling and Measurements of Generation and Recombination Currents in Thin-Film SOI Gated-Diodes
|
---|---|
Chapter number | 19 |
Book title |
Progress in SOI Structures and Devices Operating at Extreme Conditions
|
Published by |
Springer, Dordrecht, January 2002
|
DOI | 10.1007/978-94-010-0339-1_19 |
Book ISBNs |
978-1-4020-0576-3, 978-9-40-100339-1
|
Authors |
T. E. Rudenko, V. I. Kilchytska, Rudenko, T. E., Kilchytska, V. I. |