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Chapter title |
Performance and Reliability of Deep Submicron SOI Mosfets in a Wide Temperature Range
|
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Chapter number | 8 |
Book title |
Progress in SOI Structures and Devices Operating at Extreme Conditions
|
Published by |
Springer, Dordrecht, January 2002
|
DOI | 10.1007/978-94-010-0339-1_8 |
Book ISBNs |
978-1-4020-0576-3, 978-9-40-100339-1
|
Authors |
F. Balestra, Balestra, F. |