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Chapter title |
Defect Creation Mechanisms Due to Hot-Carriers in 0.15 μm SIMOX MOSFETs
|
---|---|
Chapter number | 20 |
Book title |
Progress in SOI Structures and Devices Operating at Extreme Conditions
|
Published by |
Springer, Dordrecht, January 2002
|
DOI | 10.1007/978-94-010-0339-1_20 |
Book ISBNs |
978-1-4020-0576-3, 978-9-40-100339-1
|
Authors |
P. Dimitrakis, J. Jomaah, F. Balestra, G. J. Papaioannou, Dimitrakis, P., Jomaah, J., Balestra, F., Papaioannou, G. J. |