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Wafer Level 3-D ICs Process Technology

Overview of attention for book
Attention for Chapter 14: Thermal Challenges of 3D ICs
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Citations

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1 Mendeley
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Chapter title
Thermal Challenges of 3D ICs
Chapter number 14
Book title
Wafer Level 3-D ICs Process Technology
Published by
Springer, Boston, MA, January 2008
DOI 10.1007/978-0-387-76534-1_14
Book ISBNs
978-0-387-76532-7, 978-0-387-76534-1
Authors

Sheng-Chih Lin, Kaustav Banerjee, Lin, Sheng-Chih, Banerjee, Kaustav

Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 1 Mendeley reader of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Canada 1 100%

Demographic breakdown

Readers by professional status Count As %
Student > Ph. D. Student 3 300%
Student > Master 2 200%
Professor 1 100%
Student > Doctoral Student 1 100%
Researcher 1 100%
Other 0 0%
Readers by discipline Count As %
Engineering 6 600%
Materials Science 1 100%
Design 1 100%