You are seeing a free-to-access but limited selection of the activity Altmetric has collected about this research output.
Click here to find out more.
Mendeley readers
Chapter title |
Estimation of the Charge Collection for the Soft-Error Immunity by the 3D-Device Simulation and the Quantitative Investigation
|
---|---|
Chapter number | 73 |
Book title |
Simulation of Semiconductor Devices and Processes
|
Published by |
Springer, Vienna, January 1995
|
DOI | 10.1007/978-3-7091-6619-2_73 |
Book ISBNs |
978-3-70-917363-3, 978-3-70-916619-2
|
Authors |
Y. Ohno, T. Kishimoto, K. Sonoda, H. Sayama, S. Komori, A. Kinomura, Y. Horino, K. Fujii, T. Nishimura, N. Kotani, M. Takai, H. Miyoshi |
Mendeley readers
The data shown below were compiled from readership statistics for 1 Mendeley reader of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
Country | Count | As % |
---|---|---|
Unknown | 1 | 100% |
Demographic breakdown
Readers by professional status | Count | As % |
---|---|---|
Student > Ph. D. Student | 1 | 100% |
Readers by discipline | Count | As % |
---|---|---|
Computer Science | 1 | 100% |