↓ Skip to main content
What is this page? Embed badge

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Overview of attention for book
Cover of 'Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits'

Table of Contents

  1. Altmetric Badge
    Book Overview
  2. Altmetric Badge
    Chapter 1 Introduction
  3. Altmetric Badge
    Chapter 2 Functional and Parametric Defect Models
  4. Altmetric Badge
    Chapter 3 Digital CMOS Fault Modeling
  5. Altmetric Badge
    Chapter 4 Defects in Logic Circuits and their Test Implications
  6. Altmetric Badge
    Chapter 5 Testing Defects and Parametric Variations in RAMs
  7. Altmetric Badge
    Chapter 6 Defect-Oriented Analog Testing
  8. Altmetric Badge
    Chapter 7 Yield Engineering
  9. Altmetric Badge
    Chapter 8 Conclusion
Attention for Chapter 7: Yield Engineering
Altmetric Badge

Citations

dimensions_citation
35 Dimensions

Readers on

mendeley
14 Mendeley
Summary Dimensions citations
So far, Dimensions has found 35 publications that cite this research output.

35

The most recent citing publications are shown below. View all 35 publications that cite this research output on Dimensions.

This page shows the most recent citations of this research output.

Click here to find out how to access more activity.

This page is provided by Altmetric.