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| Chapter title |
Digital CMOS Fault Modeling
|
|---|---|
| Chapter number | 3 |
| Book title |
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
|
| Published by |
Springer, Boston, MA, January 2007
|
| DOI | 10.1007/0-387-46547-2_3 |
| Book ISBNs |
978-0-387-46546-3, 978-0-387-46547-0
|
| Authors |
Manoj Sachdev, José Pineda de Gyvez |