You are seeing a free-to-access but limited selection of the activity Altmetric has collected about this research output.
Click here to find out more.
| Chapter title |
Conclusion
|
|---|---|
| Chapter number | 8 |
| Book title |
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
|
| Published by |
Springer, Boston, MA, January 2007
|
| DOI | 10.1007/0-387-46547-2_8 |
| Book ISBNs |
978-0-387-46546-3, 978-0-387-46547-0
|
| Authors |
Manoj Sachdev, José Pineda de Gyvez |