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Mendeley readers
| Chapter title |
Defects in Logic Circuits and their Test Implications
|
|---|---|
| Chapter number | 4 |
| Book title |
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
|
| Published by |
Springer, Boston, MA, January 2007
|
| DOI | 10.1007/0-387-46547-2_4 |
| Book ISBNs |
978-0-387-46546-3, 978-0-387-46547-0
|
| Authors |
Manoj Sachdev, José Pineda de Gyvez |
Mendeley readers
The data shown below were compiled from readership statistics for 1 Mendeley reader of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
| Country | Count | As % |
|---|---|---|
| Unknown | 1 | 100% |
Demographic breakdown
| Readers by professional status | Count | As % |
|---|---|---|
| Lecturer > Senior Lecturer | 1 | 100% |
| Readers by discipline | Count | As % |
|---|---|---|
| Engineering | 1 | 100% |