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Mendeley readers
| Title |
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
|
|---|---|
| Published by |
Springer US, June 2007
|
| DOI | 10.1007/0-387-46547-2 |
| ISBNs |
978-0-387-46546-3, 978-0-387-46547-0
|
| Editors |
Sachdev, Manoj, Gyvez, José Pineda de |
Mendeley readers
The data shown below were compiled from readership statistics for 41 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
| Country | Count | As % |
|---|---|---|
| United Kingdom | 1 | 2% |
| Portugal | 1 | 2% |
| Unknown | 39 | 95% |
Demographic breakdown
| Readers by professional status | Count | As % |
|---|---|---|
| Student > Ph. D. Student | 13 | 32% |
| Researcher | 9 | 22% |
| Student > Master | 5 | 12% |
| Student > Bachelor | 3 | 7% |
| Student > Doctoral Student | 2 | 5% |
| Other | 8 | 20% |
| Unknown | 1 | 2% |
| Readers by discipline | Count | As % |
|---|---|---|
| Engineering | 17 | 41% |
| Materials Science | 5 | 12% |
| Chemistry | 4 | 10% |
| Computer Science | 4 | 10% |
| Physics and Astronomy | 4 | 10% |
| Other | 4 | 10% |
| Unknown | 3 | 7% |