Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

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Cover of 'Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits'

Table of Contents

Attention for Chapter 8: Conclusion

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Citations

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So far, Dimensions has found 35 publications that cite this research output.

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Logic Test Vehicles for High Resolution Diagnosis of Systematic FEOL/MEOL Yield Detractors

Conference proceeding (October 2023)

Soft fault diagnosis in linear circuits: Test selection and non-iterative identification procedure

Article in Measurement (August 2023)

Integer Algorithm: A Useful Tool for Fault Diagnosis of Analog Circuits

Article in Circuits, Systems, and Signal Processing (April 2023)

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