IC with test structures and e-beam pads embedded within a contiguous standard cell area Grant US-11107804-B1 United States of America 31 Aug 2021
IC with test structures and e-beam pads embedded within a contiguous standard cell area Grant US-11081477-B1 United States of America 03 Aug 2021
IC with test structures and e-beam pads embedded within a contiguous standard cell area Grant US-11081476-B1 United States of America 03 Aug 2021
IC with test structures and E-beam pads embedded within a contiguous standard cell area Grant US-11075194-B1 United States of America 27 Jul 2021