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| Chapter title |
Data Analysis
|
|---|---|
| Chapter number | 10 |
| Book title |
Microelectronic Test Structures for CMOS Technology
|
| Published by |
Springer, New York, NY, January 2011
|
| DOI | 10.1007/978-1-4419-9377-9_10 |
| Book ISBNs |
978-1-4419-9376-2, 978-1-4419-9377-9
|
| Authors |
Manjul Bhushan, Mark B. Ketchen, Bhushan, Manjul, Ketchen, Mark B. |