↓ Skip to main content

Microelectronic Test Structures for CMOS Technology

Overview of attention for book
Attention for Chapter 3: Resistors
Altmetric Badge

Citations

dimensions_citation
18 Dimensions
You are seeing a free-to-access but limited selection of the activity Altmetric has collected about this research output. Click here to find out more.
Chapter title
Resistors
Chapter number 3
Book title
Microelectronic Test Structures for CMOS Technology
Published by
Springer, New York, NY, January 2011
DOI 10.1007/978-1-4419-9377-9_3
Book ISBNs
978-1-4419-9376-2, 978-1-4419-9377-9
Authors

Manjul Bhushan, Mark B. Ketchen, Bhushan, Manjul, Ketchen, Mark B.