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Mendeley readers
| Title |
Microelectronic Test Structures for CMOS Technology
|
|---|---|
| Published by |
Springer New York, August 2011
|
| DOI | 10.1007/978-1-4419-9377-9 |
| ISBNs |
978-1-4419-9376-2, 978-1-4419-9377-9
|
| Authors |
Bhushan, Manjul, Ketchen, Mark B. |
Mendeley readers
The data shown below were compiled from readership statistics for 48 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
| Country | Count | As % |
|---|---|---|
| United States | 1 | 2% |
| United Arab Emirates | 1 | 2% |
| Unknown | 46 | 96% |
Demographic breakdown
| Readers by professional status | Count | As % |
|---|---|---|
| Student > Ph. D. Student | 14 | 29% |
| Researcher | 9 | 19% |
| Student > Master | 6 | 13% |
| Other | 5 | 10% |
| Student > Doctoral Student | 3 | 6% |
| Other | 4 | 8% |
| Unknown | 7 | 15% |
| Readers by discipline | Count | As % |
|---|---|---|
| Engineering | 27 | 56% |
| Materials Science | 6 | 13% |
| Physics and Astronomy | 3 | 6% |
| Computer Science | 2 | 4% |
| Unspecified | 1 | 2% |
| Other | 1 | 2% |
| Unknown | 8 | 17% |