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Mendeley readers
| Chapter title |
High-Speed Characterization
|
|---|---|
| Chapter number | 7 |
| Book title |
Microelectronic Test Structures for CMOS Technology
|
| Published by |
Springer, New York, NY, January 2011
|
| DOI | 10.1007/978-1-4419-9377-9_7 |
| Book ISBNs |
978-1-4419-9376-2, 978-1-4419-9377-9
|
| Authors |
Manjul Bhushan, Mark B. Ketchen, Bhushan, Manjul, Ketchen, Mark B. |
Mendeley readers
The data shown below were compiled from readership statistics for 4 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
| Country | Count | As % |
|---|---|---|
| Unknown | 4 | 100% |
Demographic breakdown
| Readers by professional status | Count | As % |
|---|---|---|
| Student > Ph. D. Student | 2 | 50% |
| Other | 2 | 50% |
| Readers by discipline | Count | As % |
|---|---|---|
| Engineering | 3 | 75% |
| Physics and Astronomy | 1 | 25% |