Microelectronic Test Structures for CMOS Technology

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Cover of 'Microelectronic Test Structures for CMOS Technology'

Table of Contents

Attention for Chapter 7: High-Speed Characterization

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dimensions_citation: 18 Dimensions

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So far, Dimensions has found 18 publications that cite this research output.

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RF and Time-domain Techniques for Evaluating Novel Semiconductor Transistors

Monograph (January 2022)

Contactless scribe-test monitor with photovoltaic power, VLC downlink and IR-UWB uplink

Article in Analog Integrated Circuits and Signal Processing (May 2021)

Printing Technologies for Integration of Electronic Devices and Sensors

Book chapter (March 2020)

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