Microelectronic Test Structures for CMOS Technology

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Cover of 'Microelectronic Test Structures for CMOS Technology'

Table of Contents

Attention for Chapter 9: Test Equipment and Measurements

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Citations

dimensions_citation: 18 Dimensions

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So far, Dimensions has found 18 publications that cite this research output.

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The most recent citing publications are shown below. View all 18 publications that cite this research output on Dimensions.

Performance Improvement Induced by Metal Gate Undercut for Ring Oscillator

Article in IEEE Electron Device Letters (April 2023)

RF and Time-domain Techniques for Evaluating Novel Semiconductor Transistors

Monograph (January 2022)

Contactless scribe-test monitor with photovoltaic power, VLC downlink and IR-UWB uplink

Article in Analog Integrated Circuits and Signal Processing (May 2021)

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