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Chapter title |
Interface Degradation in Short-Channel MOSFETs
|
---|---|
Chapter number | 61 |
Book title |
The Physics and Technology of Amorphous SiO 2
|
Published by |
Springer, Boston, MA, January 1988
|
DOI | 10.1007/978-1-4613-1031-0_61 |
Book ISBNs |
978-1-4612-8301-0, 978-1-4613-1031-0
|
Authors |
H. Haddara, S. Cristoloveanu, B. Boukriss, A. Chovet, P. Jarron, Haddara, H., Cristoloveanu, S., Boukriss, B., Chovet, A., Jarron, P. |