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Noise in Nanoscale Semiconductor Devices

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Cover of 'Noise in Nanoscale Semiconductor Devices'

Table of Contents

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    Book Overview
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    Chapter 1 Origins of 1/ f Noise in Electronic Materials and Devices: A Historical Perspective
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    Chapter 2 Noise and Fluctuations in Fully Depleted Silicon-on-Insulator MOSFETs
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    Chapter 3 Noise in Resistive Random Access Memory Devices
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    Chapter 4 Systematic Characterization of Random Telegraph Noise and Its Dependence with Magnetic Fields in MOSFET Devices
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    Chapter 5 Principles and Applications of I g -RTN in Nano-scaled MOSFET
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    Chapter 6 Random Telegraph Noise in Flash Memories
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    Chapter 7 Advanced Electrical Characterization of Single Oxide Defects Utilizing Noise Signals
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    Chapter 8 Measurement and Simulation Methods for Assessing SRAM Reliability Against Random Telegraph Noise
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    Chapter 9 Random Telegraph Noise Under Switching Operation
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    Chapter 10 Low-Frequency Noise in III–V, Ge, and 2D Transistors
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    Chapter 11 Detection and Characterization of Single Defects in MOSFETs
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    Chapter 12 Random Telegraph Noise Nano-spectroscopy in High-κ Dielectrics Using Scanning Probe Microscopy Techniques
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    Chapter 13 RTN and Its Intrinsic Interaction with Statistical Variability Sources in Advanced Nano-Scale Devices: A Simulation Study
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    Chapter 14 Advanced Characterization and Analysis of Random Telegraph Noise in CMOS Devices
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    Chapter 15 An Overview on Statistical Modeling of Random Telegraph Noise in the Frequency Domain
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    Chapter 16 Defect-Based Compact Modeling of Random Telegraph Noise
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    Chapter 17 Oxide Trap-Induced RTS in MOSFETs
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    Chapter 18 Atomistic Modeling of Oxide Defects
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    Chapter 19 The Langevin–Boltzmann Equation for Noise Calculation
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    Chapter 20 Benchmark Tests for MOSFET Thermal Noise Models
Attention for Chapter 10: Low-Frequency Noise in III–V, Ge, and 2D Transistors
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Citations

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Chapter title
Low-Frequency Noise in III–V, Ge, and 2D Transistors
Chapter number 10
Book title
Noise in Nanoscale Semiconductor Devices
Published by
Springer, Cham, January 2020
DOI 10.1007/978-3-030-37500-3_10
Book ISBNs
978-3-03-037499-0, 978-3-03-037500-3
Authors

Mengwei Si, Xuefei Li, Wangran Wu, Sami Alghamdi, Peide Ye, Si, Mengwei, Li, Xuefei, Wu, Wangran, Alghamdi, Sami, Ye, Peide

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Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 3 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Unknown 3 100%

Demographic breakdown

Readers by professional status Count As %
Student > Ph. D. Student 2 67%
Professor 1 33%
Readers by discipline Count As %
Engineering 2 67%
Physics and Astronomy 1 33%

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