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Mendeley readers
Chapter title |
Defect-Based Compact Modeling of Random Telegraph Noise
|
---|---|
Chapter number | 16 |
Book title |
Noise in Nanoscale Semiconductor Devices
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Published by |
Springer, Cham, January 2020
|
DOI | 10.1007/978-3-030-37500-3_16 |
Book ISBNs |
978-3-03-037499-0, 978-3-03-037500-3
|
Authors |
Pieter Weckx, Ben Kaczer, Marko Simicic, Bertrand Parvais, Dimitri Linten, Weckx, Pieter, Kaczer, Ben, Simicic, Marko, Parvais, Bertrand, Linten, Dimitri |
Mendeley readers
The data shown below were compiled from readership statistics for 2 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
Country | Count | As % |
---|---|---|
Unknown | 2 | 100% |
Demographic breakdown
Readers by professional status | Count | As % |
---|---|---|
Researcher | 2 | 100% |
Readers by discipline | Count | As % |
---|---|---|
Engineering | 2 | 100% |