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Mendeley readers
Chapter title |
RTN and Its Intrinsic Interaction with Statistical Variability Sources in Advanced Nano-Scale Devices: A Simulation Study
|
---|---|
Chapter number | 13 |
Book title |
Noise in Nanoscale Semiconductor Devices
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Published by |
Springer, Cham, January 2020
|
DOI | 10.1007/978-3-030-37500-3_13 |
Book ISBNs |
978-3-03-037499-0, 978-3-03-037500-3
|
Authors |
F. Adamu-Lema, C. Monzio Compagnoni, O. Badami, V. Georgiev, A. Asenov, Adamu-Lema, F., Compagnoni, C. Monzio, Badami, O., Georgiev, V., Asenov, A. |
Mendeley readers
The data shown below were compiled from readership statistics for 3 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
Country | Count | As % |
---|---|---|
Unknown | 3 | 100% |
Demographic breakdown
Readers by professional status | Count | As % |
---|---|---|
Student > Ph. D. Student | 2 | 67% |
Student > Master | 1 | 33% |
Readers by discipline | Count | As % |
---|---|---|
Engineering | 3 | 100% |