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Noise in Nanoscale Semiconductor Devices

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Cover of 'Noise in Nanoscale Semiconductor Devices'

Table of Contents

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    Book Overview
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    Chapter 1 Origins of 1/ f Noise in Electronic Materials and Devices: A Historical Perspective
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    Chapter 2 Noise and Fluctuations in Fully Depleted Silicon-on-Insulator MOSFETs
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    Chapter 3 Noise in Resistive Random Access Memory Devices
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    Chapter 4 Systematic Characterization of Random Telegraph Noise and Its Dependence with Magnetic Fields in MOSFET Devices
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    Chapter 5 Principles and Applications of I g -RTN in Nano-scaled MOSFET
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    Chapter 6 Random Telegraph Noise in Flash Memories
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    Chapter 7 Advanced Electrical Characterization of Single Oxide Defects Utilizing Noise Signals
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    Chapter 8 Measurement and Simulation Methods for Assessing SRAM Reliability Against Random Telegraph Noise
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    Chapter 9 Random Telegraph Noise Under Switching Operation
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    Chapter 10 Low-Frequency Noise in III–V, Ge, and 2D Transistors
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    Chapter 11 Detection and Characterization of Single Defects in MOSFETs
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    Chapter 12 Random Telegraph Noise Nano-spectroscopy in High-κ Dielectrics Using Scanning Probe Microscopy Techniques
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    Chapter 13 RTN and Its Intrinsic Interaction with Statistical Variability Sources in Advanced Nano-Scale Devices: A Simulation Study
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    Chapter 14 Advanced Characterization and Analysis of Random Telegraph Noise in CMOS Devices
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    Chapter 15 An Overview on Statistical Modeling of Random Telegraph Noise in the Frequency Domain
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    Chapter 16 Defect-Based Compact Modeling of Random Telegraph Noise
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    Chapter 17 Oxide Trap-Induced RTS in MOSFETs
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    Chapter 18 Atomistic Modeling of Oxide Defects
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    Chapter 19 The Langevin–Boltzmann Equation for Noise Calculation
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    Chapter 20 Benchmark Tests for MOSFET Thermal Noise Models
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Title
Noise in Nanoscale Semiconductor Devices
Published by
Springer International Publishing, May 2020
DOI 10.1007/978-3-030-37500-3
ISBNs
978-3-03-037499-0, 978-3-03-037500-3
Editors

Grasser, Tibor

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Mendeley readers

The data shown below were compiled from readership statistics for 47 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Unknown 47 100%

Demographic breakdown

Readers by professional status Count As %
Student > Ph. D. Student 17 36%
Student > Bachelor 4 9%
Student > Doctoral Student 3 6%
Researcher 3 6%
Professor 2 4%
Other 2 4%
Unknown 16 34%
Readers by discipline Count As %
Engineering 18 38%
Physics and Astronomy 6 13%
Materials Science 3 6%
Biochemistry, Genetics and Molecular Biology 1 2%
Chemical Engineering 1 2%
Other 0 0%
Unknown 18 38%